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Vendor: Huawei

Exam Code: H13-321_V2.0-ENU Dumps

Questions and Answers: 104

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NEW QUESTION: 1
各ドロップダウンリストから適切な攻撃と修復を選択して、対応する攻撃にその修復のラベルを付けます。
指示
すべての攻撃と修復アクションが使用されるわけではありません。シミュレーションの初期状態に戻したい場合は、いつでも[すべてリセット]ボタンをクリックしてください。


Answer:
Explanation:
check the answer below.
Explanation
Use the following settings for answer this simulation question.


NEW QUESTION: 2
소프트웨어 테스팅에 대한 상향식 또는 하향식 방식의 장점은 다음과 같습니다.
A. 주요 기능 및 처리가 일찍 테스트됩니다.
B. 시스템에 대한 신뢰가 일찍 달성됩니다.
C. 중요한 모듈의 오류가 일찍 감지됩니다.
D. 인터페이스 오류가 더 일찍 감지됩니다.
Answer: C
Explanation:
설명:
소프트웨어 테스팅에 대한 상향식 접근법은 프로그램 및 모듈과 같은 원자 단위 테스트로 시작하여 완전한 시스템 테스트가 수행 될 때까지 상향식으로 작동합니다. 소프트웨어 테스팅에 상향식 접근법을 사용하면 얻을 수있는 장점은 스텁이나 드라이버가 필요없고 중요 모듈의 오류가 일찍 발견된다는 것입니다. 이 질문의 다른 선택 모두는 하향식 접근법의 이점을 참조하며, 깊이 형 또는 폭 우선 검색 순서에서 반대 경로를 따른다.

NEW QUESTION: 3
View the Exhibit and examine the structure of the EMP table which is not partitioned and not an index-organized table. (Choose two.)

Evaluate this SQL statement:
ALTER TABLE emp
DROP COLUMN first_name;
Which two statements are true?
A. The FIRST_NAME column can be dropped even if it is part of a composite PRIMARY KEY provided the CASCADE option is added to the SQL statement.
B. The FIRST_NAME column would be dropped provided at least one column remains in the table.
C. The drop of the FIRST_NAME column can be rolled back provided the SET UNUSED option is added to the SQL statement.
D. The FIRST_NAME column would be dropped provided it does not contain any data.
Answer: B


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